Defect Detection on Texture using Statistical Approach

Authors

  • Siana Halim Industrial Engineering Petra Christian University Surabaya - Indonesia

DOI:

https://doi.org/10.9744/jti.17.2.89-96

Keywords:

Hill estimator, kernel density estimate, image histogram, wavelet, texture, defect.

Abstract

In this paper we present several techniques for detecting simple defect on the texture. The simple defect means, that the defect can be detected via image histogram or via wavelet of the image histogram. Hill estimator is one of the techniques that we suggest to use to solve this problem, since it does not need estimate parameters for estimating the image density

References

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Published

2016-10-07